Herbert Wertheim College of Engineering
SCAN Lab
Led by Domenic Forte · Electrical and Computer Engineering
What we study
The FICS Research SCAN Lab studies hardware security and trust, focusing on detecting counterfeit electronic chips and securing integrated circuits. Their methods involve analyzing integrated circuit design and fabrication processes.
What working here is like
- Computational
- No organisms (data only)
- Coding required
- Projects
- 2
- Papers
- 5
Current projects
NSF Project
Investigating untrusted entities in integrated circuit design and fabrication to prevent IP theft or tampering.
Enhancing AI Security with FPGA-Accelerated Differentiable Logic Gate Networks
The lab builds AI models that learn logical operations instead of neural weights and runs them on FPGA hardware. Students will design and test these differentiable logic gate networks to make AI faster, more interpretable, and harder to trick with adversarial attacks.
From the Spring 2025 UF Undergraduate Research Symposium · abstract book, p. 336
Summaries are written by AI in plain language from public symposium abstracts and may be imperfect.
Recent papers, explained
- Reading Between the Signals: A Comprehensive Tutorial on Harnessing Physical Side-Channels for Anomaly Detection
2026 · IEEE Access
Explains how to detect system problems using signals like power or heat.
- From Capture–Recapture to No Recapture: Efficient SCAD Even After Software Updates
2025 · Sensors
Tests whether side-channel signals can detect software changes in devices.
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- A Persistent Hierarchical Bloom Filter-based Framework for Scalable Authentication and Tracking of ICs
2025 · ACM Journal on Emerging Technologies in Computing Systems
Builds a system to track and authenticate electronic chips using unique codes.
- Sense and React: Self-Destructive Polymorphic Mechanism Against Voltage Tampered Active Physical Attacks
2025 · IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Creates a way to destroy secrets if someone tries to hack a device.
- IC SEM Reverse Engineering Tutorial Using Artificial Intelligence
2025 · IEEE Design and Test
Shows how AI can help analyze images of electronic chips.
Plain-language summaries are AI-written and reviewed by us; check the paper for details.
How to reach out
Domenic Forte hasn't set up this page yet. Their UF Scholars profile lists their publications.